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Detecting and Locating Canceling Faults in Shunt Capacitor Banks Item Info

Title:
Detecting and Locating Canceling Faults in Shunt Capacitor Banks
Creator:
Mohammad Al Ebedan; Zesheng Guo; PeiCheng Ji; Zeying Chen
Date Created (Archival Standard):
2023
Date Created (ISO Standard):
2023
Description:
2023 Engineering Design EXPO poster entitled "Detecting and Locating Canceling Faults in Shunt Capacitor Banks," created by Mohammad Al Ebedan, Zesheng Guo, PeiCheng Ji, Zeying Chen. University of Idaho College of Engineering, Department of Electrical and Computer Engineering.
Subjects:
electrical engineering engineering instructional posters
Location:
Moscow, Idaho
Series:
Expo Posters
Source:
Engineering Design EXPO posters, UG 191, University of Idaho Special Collections and Archives, https://www.lib.uidaho.edu/special-collections/
Finding Aid:
https://archiveswest.orbiscascade.org/ark:80444/xv920797
Source Identifier:
expo2023-025
Type:
Text
Format:
application/pdf
Language:
eng

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Attribution
Citation:
"Detecting and Locating Canceling Faults in Shunt Capacitor Banks", College of Engineering Repository, University of Idaho Library Digital Collections, https://www.lib.uidaho.edu/digital/engrir/items/engrir165.html
Rights
Rights:
In copyright, educational use permitted. Educational use includes non-commercial reproduction of text and images in materials for teaching and research purposes. For other contexts beyond fair use, including digital reproduction, please contact the University of Idaho Library Special Collections and Archives Department at libspec@uidaho.edu. The University of Idaho Library is not liable for any violations of the law by users.
Standardized Rights:
http://rightsstatements.org/vocab/InC-EDU/1.0/